phoenix nanome|x High-Resolution Nanofocus X-Ray Inspection System

An ultra high-resolution nanofocus X-ray inspection system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries.

Innovative and unique features and an extreme high positioning accuracy make nanome|x the effective and reliable solution for a wide spectrum of 2D and 3D offline inspection tasks: R&D, failure analysis, process and quality control.

Superior dual detector technology (digital image chain and active temperature-stabilized digital detector with 30 fps) for brilliant live images

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